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On this page, you can select 「MainGroup」 or 「Facet」 in G01N. |
HB:Handbook | ||||
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Select the desired 「MainGroup」 or 「facet」 etc. |
CC:Concordance | ||||
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Sampling; Preparing specimens for investigation (handling materials for automatic analysis G01N35/00) | HB | CC | 2G052 | |
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Investigating strength properties of solid materials by application of mechanical stress | HB | CC | 2G061 | |
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Analysing materials by weighing, e.g. weighing small particles separated from a gas or liquid (G01N 9/00 takes precedence) | HB | CC | 2G062 | |
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Analysing materials by measuring the pressure or volume of a gas or vapour | HB | CC | 2G062 | |
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Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity | HB | CC | 2G062 | |
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Investigating flow properties of materials e.g. viscosity or plasticity; Analysing materials by determining flow properties | HB | CC | 2G048 | |
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Investigating surface or boundary effects, e.g. wetting power; Investigating diffusion effects; Analysing materials by determining surface, boundary, or diffusion effects (scanning-probe techniques or apparatus G01Q) [1,7] | HB | CC | 2G048 | |
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Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials (identification of microorganisms C12Q)[2024.01] | HB | CC | 2G049 | |
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Investigating resistance of materials to the weather, to corrosion, or to light | HB | CC | 2G050 | |
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Investigating materials by mechanical methods (G01N 3/00-G01N 17/00 take precedence) | HB | CC | 2G050 | |
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Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light (G01N 3/00-G01N 19/00 take precedence) [2006.01] | HB | CC | 2G059 | |
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Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more (G01N 3/00-G01N 17/00, G01N 24/00 take precedence) [2006.01] | HB | CC | 2G044 | |
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Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00-G01N17/00, G01N21/00 or G01N22/00 | HB | CC | 2G001 | |
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Investigating or analysing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects [3, 4, 5] | HB | CC | 2G044 | |
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Investigating or analysing materials by the use of thermal means (G01N 3/00-G01N 23/00 take precedence) | HB | CC | 2G040 | |
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Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means (G01N 3/00-G01N 25/00 take precedence; measurement or testing of electric or magnetic variables or of electric or magnetic properties of materials G01R) | HB | CC | 2G060 | |
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Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object () [4] | HB | CC | 2G047 | |
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Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography (G01N 3/00-G01N 29/00; take precedence);; | HB | CC | 2G063 | |
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Investigating or analysing non-biological materials by the use of the chemical methods specified in the subgroups; Apparatus specially adapted for such methods [4] | HB | CC | 2G042 | |
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Investigating or analysing materials by specific methods not covered by groups G01N 1/00-G01N 31/00 | HB | CC | 2G055 | |
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Automatic analysis not limited to methods or materials provided for in any single one of groups G01N 1/00-G01N 33/00; Handling materials therefor [3] | HB | CC | 2G058 | |
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Details not covered by any other group of this subclass [3] | HB | CC | 2G058 | |