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This page displays all 「FI」 in main group G01N23/00. |
HB:Handbook | ||||
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CC:Concordance | |||||
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Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00-G01N17/00, G01N21/00 or G01N22/00 | HB | CC | 2G001 | |
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.by transmitting the radiation through the material | HB | CC | 2G001 | |
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..and forming images of the material [2018.01] | HB | CC | 2G001 | |
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...the images being dynamic images, e.g. visual observation of dynamic transparent images | HB | CC | 2G001 | |
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...forming transparent images by scanning probe beam, e.g. X-ray transparent imaging by scanned X-ray pencil beam or scanning transmission electron microscope [sTEM] | HB | CC | 2G001 | |
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...characterized by the form of display for users, e.g. simultaneous display of multiple images, superimpose display or positions on the screen | HB | CC | 2G001 | |
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...Phase-contrast imaging, e.g. using grating interferometers [2018.01] | HB | CC | 2G001 | |
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....Refraction contrast imaging | HB | CC | 2G001 | |
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...using laminography or tomosynthesis [2018.01] | HB | CC | 2G001 | |
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...using tomography, e.g. computed tomography [CT] [2018.01] | HB | CC | 2G001 | |
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....Coherent scatter computed tomography [CsCT] | HB | CC | 2G001 | |
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...using neutrons [3] | HB | CC | 2G001 | |
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..and measuring the absorption [2018.01] | HB | CC | 2G001 | |
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...the radiation being X-rays [2018.01] | HB | CC | 2G001 | |
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....X-ray absorption fine structure [XAFS], e.g. extended XAFS [EXAFS] [2018.01] | HB | CC | 2G001 | |
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....using polyenergetic X-rays [2006.01] | HB | CC | 2G001 | |
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...the radiation being neutrons [2018.01] | HB | CC | 2G001 | |
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...Gamma-ray resonance absorption, e.g. using the Mossbauer effect [2018.01] | HB | CC | 2G001 | |
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...the material being confined in a container, e.g. in luggage X-ray scanners [2018.01] | HB | CC | 2G001 | |
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...the material being a flowing fluid or a flowing granular solid [2018.01] | HB | CC | 2G001 | |
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...the material being a moving sheet or film [2018.01] | HB | CC | 2G001 | |
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...Investigating the presence of defects or foreign matter [2018.01] | HB | CC | 2G001 | |
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....inside tire | HB | CC | 2G001 | |
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.by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials [2018.01] | HB | CC | 2G001 | |
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..in combination with transmission measurement, e.g. measuring backscattered X-ray images and transparent X-ray images | HB | CC | 2G001 | |
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..Measuring reflectivity, e.g. X-ray reflectometry [XRR] | HB | CC | 2G001 | |
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..Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor (monochromators for X-rays using crystals G21K1/06) [2018.01] | HB | CC | 2G001 | |
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...Goniometers [2018.01] | HB | CC | 2G001 | |
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...Sample holders or supports therefor [2018.01] | HB | CC | 2G001 | |
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....provided with temperature control or heating means [2018.01] | HB | CC | 2G001 | |
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....for high pressure testing, e.g. anvil cells [2018.01] | HB | CC | 2G001 | |
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...Preparation of powder samples therefor [2018.01] | HB | CC | 2G001 | |
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..Measuring diffraction of electrons, e.g. low energy electron diffraction [LEED] method or reflection high energy electron diffraction [RHEED] method [2018.01] | HB | CC | 2G001 | |
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..Measuring inelastic scattering of gamma rays, e.g. Compton effect [2018.01] | HB | CC | 2G001 | |
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..Measuring the energy-dispersion spectrum [EDS] of diffracted radiation [2018.01] | HB | CC | 2G001 | |
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..Measuring small-angle scattering, e.g. small angle X-ray scattering [SAXS] [2018.01] | HB | CC | 2G001 | |
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...using neutrons [3] | HB | CC | 2G001 | |
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..Measuring back scattering [2] | HB | CC | 2G001 | |
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...using neutrons [3] | HB | CC | 2G001 | |
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..using diffraction cameras [2018.01] | HB | CC | 2G001 | |
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..Analysing diffraction patterns [2018.01] | HB | CC | 2G001 | |
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...Two dimensional pattern, e.g. analysis of diffraction images, Kikuchi line or Debye Ring | HB | CC | 2G001 | |
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...One dimensional pattern, e.g. analysis of diffraction chart, diffraction spectrum, profile or wave form pattern, e.g. Rietveld method | HB | CC | 2G001 | |
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..Diffractometry, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions [2018.01] | HB | CC | 2G001 | |
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.by measuring secondary emission from the material [2018.01] | HB | CC | 2G001 | |
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..Preparing specimens therefor [2018.01] | HB | CC | 2G001 | |
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..Specimen supports therefor; Sample conveying means therefor [2018.01] | HB | CC | 2G001 | |
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..Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement [2018.01] | HB | CC | 2G001 | |
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...all measurements being of secondary emission, e.g. combination of SE measurement and characteristic X-ray measurement [2018.01] | HB | CC | 2G001 | |
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..using wavelength dispersive spectroscopy [WDS] [2018.01] | HB | CC | 2G001 | |
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..by activation analysis [2] | HB | CC | 2G001 | |
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...using neutron activation analysis [NAA] [3] | HB | CC | 2G001 | |
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..by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence [2] | HB | CC | 2G001 | |
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..using electron or ion microprobes [2018.01] | HB | CC | 2G001 | |
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...using incident electron beams, e.g. scanning electron microscopy [SEM] [2018.01] | HB | CC | 2G001 | |
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....Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA] [2018.01] | HB | CC | 2G001 | |
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....Measuring cathodoluminescence [2018.01] | HB | CC | 2G001 | |
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...using incident ion beams, e.g. proton beams [2018.01] | HB | CC | 2G001 | |
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....Measuring excited X-rays, i.e. particle-induced X-ray emission [PIXE] [2018.01] | HB | CC | 2G001 | |
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....Measuring secondary ion emission, e.g. secondary ion mass spectrometry [SIMS] (mass-to-charge ratio analysis aspects of SIMS for material analysis G01N27/62) [2018.01] | HB | CC | 2G001 | |
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..Measuring photoelectric effect , e.g. photoelectron emission microscopy [PEEM] [2018.01] | HB | CC | 2G001 | |
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...Measuring photoelectron spectra, e.g. electron spectroscopy for chemical analysis [ESCA] or X-ray photoelectron spectroscopy [XPS] [2018.01] | HB | CC | 2G001 | |
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...using the Auger effect, e.g. Auger electron spectroscopy [AES] [2018.01] | HB | CC | 2G001 | |