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FI (list display)

  • G01N22/00
    		•  Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more (G01N 3/00-G01N 17/00, G01N 24/00 take precedence) [2006.01] HB CC 2G044
  • G01N22/00@A
    		•  Measuring densities or types of gases (G 01 N 22/04 for measuring steam) HB CC 2G044
  • G01N22/00@B
    		•  Measuring orientation or directionality HB CC 2G044
  • G01N22/00@C
    		•  By using microwave radiometers (G 01 J or G 01 R take precedence) HB CC 2G044
  • G01N22/00@D
    		•  Measuring plasma HB CC 2G044
  • G01N22/00@E
    		•  Measuring ice or snow HB CC 2G044
  • G01N22/00@F
    		•  Detecting element used for measurements (dielectric rods, dielectric resonators and others) HB CC 2G044
  • G01N22/00@G
    		•  .Wave guides HB CC 2G044
  • G01N22/00@H
    		•  ..wave guides with slots (Assign G 01 N 22/00 G to the wave guides that accommodate the specimens through the slots) HB CC 2G044
  • G01N22/00@J
    		•  ..Hollow resonators HB CC 2G044
  • G01N22/00@K
    		•  .Micro-strips HB CC 2G044
  • G01N22/00@L
    		•  .With free space or open space, antennas in general e.g. trumpet pipes HB CC 2G044
  • G01N22/00@M
    		•  Measurement methods in general HB CC 2G044
  • G01N22/00@N
    		•  .Frequency modulation of radiated microwaves HB CC 2G044
  • G01N22/00@P
    		•  .Moving the materials or sensors to change their relative positions HB CC 2G044
  • G01N22/00@Q
    		•  .Interfering or superimposing plurality of waves HB CC 2G044
  • G01N22/00@R
    		•  .By using polarised waves HB CC 2G044
  • G01N22/00@S
    		•  .By using reflected light from the measurement objects HB CC 2G044
  • G01N22/00@T
    		•  Measurement volume in general (value Q, presence of standing waves and others) HB CC 2G044
  • G01N22/00@U
    		•  .Electric power or strength HB CC 2G044
  • G01N22/00@V
    		•  .Frequencies HB CC 2G044
  • G01N22/00@W
    		•  .Phases HB CC 2G044
  • G01N22/00@X
    		•  .Amplitudes HB CC 2G044
  • G01N22/00@Y
    		•  .(Ratios) Dielectric constants or dielectric tangent HB CC 2G044
  • G01N22/00@Z
    		•  Others HB CC 2G044
  • G01N22/02
    		•  .Investigating the presence of flaws [3] HB CC 2G044
  • G01N22/02@A
    		•  Detecting flaws HB CC 2G044
  • G01N22/02@B
    		•  Detecting foreign objects HB CC 2G044
  • G01N22/02@C
    		•  CT (Tomography devices HB CC 2G044
  • G01N22/02@Z
    		•  Others HB CC 2G044
  • G01N22/04
    		•  .Investigating moisture content [3] HB CC 2G044
  • G01N22/04@A
    		•  Detecting gaseous moistures HB CC 2G044
  • G01N22/04@B
    		•  Detecting moisture content in the sheet materials HB CC 2G044
  • G01N22/04@C
    		•  Detecting moisture content in the powder or granular materials HB CC 2G044
  • G01N22/04@Z
    		•  Others HB CC 2G044
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