FI-MainGroup/Facet-Choice

  • G01B1/00
  • Measuring instruments characterised by the selection of material therefor HB CC 2F060
  • G01B3/00
  • Measuring instruments characterised by the use of mechanical techniques [1, 2, 2006.01] HB CC 2F061
  • G01B5/00
  • Measuring arrangements characterised by the use of mechanical techniques [1, 2, 2006.01] HB CC 2F062
  • G01B7/00
  • Measuring arrangements characterised by the use of electric or magnetic techniques [1, 2006.01] HB CC 2F063
  • G01B9/00
  • Measuring instruments characterised by the use of optical techniques [1, 2, 2006.01] HB CC 2F064
  • G01B11/00
  • Measuring arrangements characterised by the use of optical techniques [1, 2, 2006.01] HB CC 2F065
  • G01B13/00
  • Measuring arrangements characterised by the use of fluids [1, 2006.01] HB CC 2F066
  • G01B15/00
  • Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons (characterised by the use of optical techniques G01B 9/00, G01B 11/00) [1, 4, 2006.01] HB CC 2F067
  • G01B17/00
  • Measuring arrangements characterised by the use of infrasonic, sonic, or ultrasonic vibrations [1, 4, 2006.01] HB CC 2F068
  • G01B21/00
  • Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant [3, 2006.01] HB CC 2F069
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