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  • G01B15/00
    		•  Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons (characterised by the use of optical techniques G01B 9/00, G01B 11/00) [1, 4, 2006.01] HB CC 2F067
  • G01B15/00@A
    		•  by transmission or absorption of x-ray or gamma-ray HB CC 2F067
  • G01B15/00@H
    		•  .by image acquisition, e.g. CT images HB CC 2F067
  • G01B15/00@B
    		•  by charged particle beams HB CC 2F067
  • G01B15/00@K
    		•  .by image acquisition, e.g. SEM or TEM images HB CC 2F067
  • G01B15/00@C
    		•  by microwaves or radio waves HB CC 2F067
  • G01B15/00@Z
    		•  Others HB CC 2F067
  • G01B15/02
    		•  .for measuring thickness HB CC 2F067
  • G01B15/02@A
    		•  by transmission or absorption of x-ray or gamma-ray HB CC 2F067
  • G01B15/02@H
    		•  .by image acquisition, e.g. CT images HB CC 2F067
  • G01B15/02@B
    		•  by charged particle beams HB CC 2F067
  • G01B15/02@K
    		•  .by image acquisition, e.g. SEM or TEM images HB CC 2F067
  • G01B15/02@C
    		•  by microwaves or radio waves HB CC 2F067
  • G01B15/02@D
    		•  by using fluorescent, diffraction, photoelectric or wave characteristics HB CC 2F067
  • G01B15/02@Z
    		•  Others HB CC 2F067
  • G01B15/04
    		•  .for measuring contours or curvatures HB CC 2F067
  • G01B15/04@A
    		•  by transmission or absorption of X-rays or gamma rays HB CC 2F067
  • G01B15/04@H
    		•  .by image acquisition, e.g. CT images HB CC 2F067
  • G01B15/04@B
    		•  by electrically-charged particles HB CC 2F067
  • G01B15/04@K
    		•  .by image acquisition, e.g. SEM or TEM images HB CC 2F067
  • G01B15/04@C
    		•  by microwaves or radio waves HB CC 2F067
  • G01B15/04@Z
    		•  Others HB CC 2F067
  • G01B15/06
    		•  .for measuring the deformation in a solid HB CC 2F067
  • G01B15/08
    		•  .for measuring roughness or irregularity of surfaces [6] HB CC 2F067
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