F-Term-List

G01B15/00-15/08

AA00
CONTENT OF MEASURING

AA01

AA02

AA03

AA04

AA06

AA07

. Positions and coordinates

. . One-dimensional positions and coordinates

. . Two-dimensional positions and coordinates

. . Three-dimensional positions and coordinates

. . Distances

. . Displacement and amount of shifting

AA12

AA13

AA14

AA15

AA16

AA18

. . Others as specified

. . . Marks and patterns

. . . Seams

. . . Positional deviation

. . Edges

. Amount of eccentricity

AA21

AA22

AA23

AA24

AA25

AA26

AA27

AA28

AA29

. Length and dimensions

. . Diameter (i.e., outer diameter and inner diameter)

. . Height

. . Depth

. . Gaps

. . Width

. . Thickness

. . . Thickness distribution

. . . . References to uneven thickness rates

AA31

AA32

AA33

. Angles

. . Surface direction

. . Pattern edge inclined angles

AA41

AA42

AA43

AA44

AA45

AA46

. Configuration parameters

. . Curvature, arcuation, and radii of curvature

. . Flatness and straightness

. . Roundness and sphericity

. . Surface irregularity and unevenness

. . Surface roughness

AA51

AA52

AA53

AA54

AA57

AA58

. Profiles

. . Cross sections

. . Three-dimensional profiles

. . Patterns

. Area

. Volume

AA61

AA62

AA63

AA64

AA65

AA67

. Position, inclination, and front and back sides of objects

. Types and grades of objects, and distinguishing whether an object is good or bad

. Overlapping of objects

. Amount of wear or erosion

. Deformation of objects

. Measurement of the inner surface status of objects

BB00
CONFIGURATIONS, MATERIAL QUALITY, AND TYPES OF TARGETED OBJECTS

BB01

BB02

BB04

BB05

BB06

BB07

BB08

BB09

. Flat plates (i.e., whereby the longitudinal direction cannot be specified)

. . Discoid configurations

. Objects having patterns

. Hollow configurations

. . Tubular and pipe-shaped configurations

. Spherical configurations

. Annular configurations

. Columnar and cylindrical configurations (i.e., excluding BB06)

BB11

BB12

BB13

BB14

BB15

BB16

BB17

BB18

BB19

BB20

. Long bodies and bodies that are continuously conveyed

. . Flat plate-shaped bodies (i.e., whereby the longitudinal direction can be specified)

. . Linear bodies

. Bodies that are not continuously conveyed

. Rotating bodies

. Objects having multiple-layer structures

. . Covered elements

. . . Plating thicknesses and deposition thicknesses

. . . Applications (e.g., amounts and thicknesses)

. Liquids (e.g., oil films)

BB21

BB22

BB24

BB25

BB26

BB27

. Objects having marks on targeted substances

. . Objects characterized by mark configurations

. Dangerous and high-temperature objects

. Soil and concrete

. Plastic and rubber

. Glass and ceramics

CC00
TARGETED OBJECTS (I.E., SPECIFIC EXAMPLES)

CC01

CC02

CC03

CC04

CC05

CC06

CC07

CC08

CC09

CC10

. Objects related to atomic power

. Vehicles and trains

. Round and square rods

. Square materials (e.g., H- and T-shaped steel)

. Steel plates

. Steel tubes

. Deposits and precipitates

. Films and sheets

. Cables and electric wires

. Road surfaces

CC11

CC12

CC13

CC14

CC15

CC16

CC17

CC18

CC19

. Tires

. Blades for turbines

. Disks (e.g., optical and magnetic)

. Printed circuit boards

. Objects related to semiconductors

. . Masks

. . Wafers

. Pins and containers

. Human bodies, animals, and organisms

DD00
SUBSTANCES AND ELEMENTS COMPRISING OBJECTS TO BE MEASURED

DD01

DD02

DD03

DD04

DD05

DD06

DD07

DD08

DD09

DD10

. Metals (i.e., including alloys)

. . Manganese, iron and chromium

. . Nickel, lead and cobalt

. . Cadmium, gold, mercury, and silver

. . Zinc, tin, and copper

. . Magnesium and aluminum

. Other elements

. Metal compounds

. Organic substances

. Other compounds and substances

EE00
OBJECTIVES

EE01

EE02

EE03

EE04

EE05

EE06

EE09

EE10

. Reduction of electric power consumption

. Reduction of size or weight

. Improvement of S/N (i.e., signal-to-noise) ratio and noise reduction

. Improvement of resolution

. Improvement of operability

. Detection of abnormalities in measuring systems (e.g., detection of trouble)

. Prevention of malfunction

. Establishment of high-speed processing and automation of measuring

EE11

EE12

EE13

EE14

EE15

EE16

EE17

EE18

EE19

. Disturbance component countermeasures

. . Heat insulation

. . Prevention of vibration

. . E-H countermeasures and prevention of electrostatic charges

. Protection

. . Protection of objects to be measured or standards

. . Protection of human bodies and organisms

. . Protection of devices themselves (e.g., improvement of durability)

. Facilitation of maintenance and inspection

FF00
CORRECTION, COMPENSATION, CALIBRATION, AND ADJUSTMENT

FF01

FF02

FF03

FF04

FF05

FF06

FF07

FF08

FF09

. References to correction, compensation, and factors thereof

. . Calculation errors and non-linearity of detection systems

. . Adhered substances and dust

. . Water and moisture

. . Pressure and atmospheric pressure

. . Heat

. . Material quality and absorption moduli and density

. . Volume, weight, and thickness

. . Vibration

FF11

FF12

FF13

FF14

FF15

FF16

FF17

FF18

. . Vibration

. . Angle (e.g., pass angle)

. . Distance (e.g., pass lines)

. Calibration

. Adjustment

. . Zero position and offset

. . Sensitivity

. . Magnification

GG00
STANDARDS AND REFERENCES

GG01

GG02

GG03

GG04

GG05

GG06

GG07

GG08

GG09

. Items used as references

. . Reference radiation sources

. . Wedge-shaped reference plates

. . Reference plates of multiple types and in multiple units

. . Electrical references

. . Use of memory means

. . Actual objects

. . Data from normal products and design data

. . Targeted objects

HH00
INCIDENT PARTICLES, WAVE MOTION, RADIATION SOURCES, AND TUBES IN TARGETED OBJECTS

HH01

HH02

HH03

HH04

HH05

HH06

HH07

HH08

HH09

HH10

. Electromagnetic waves

. . Microwaves

. . . Pulse waves

. . X-rays

. . Gamma rays

. Negative electron (e.g., beta) particles

. Neutral particles and neutrons

. Ions and alpha particles

. Descriptions of irradiated waves only

. Others (e.g., particles, wave movements, and stimuli)

HH11

HH12

HH13

HH14

HH15

HH16

HH17

HH18

. Radio isotopes

. X-ray tubes

. Electron guns

. Other wave sources and guns

. References to energy (i.e., E) or wavelengths (i.e., greek small letter lambda)

. Pluralities and combinations of types, energy, wavelengths, radiation sources, and the like

. Objects whereby there is no reference to a specific incident direction

. Combined uses of radiation sources and guns

JJ00
OUTGOING PARTICLES AND WAVE MOTION OF TARGETED PARTICLES

JJ01

JJ02

JJ03

JJ04

JJ05

JJ06

JJ07

JJ08

JJ09

JJ10

. Electromagnetic waves

. . Microwaves

. . X-rays

. . Gamma rays

. Negative electron (e.g., beta) particles

. Neutral particles and neutrons

. Ions and alpha particles

. Descriptions of irradiated waves only

. References to energy (i.e., E) or wavelengths (i.e., greek small letter lambda)

. Pluralities and combinations of types, energy, and wavelengths

KK00
PHENOMENA AND MEASURING METHODS UTILIZED OR REFERRED TO

KK01

KK02

KK03

KK04

KK05

KK06

KK07

KK08

KK09

KK10

. Fluorescent x-rays (i.e., by means of X-ray and gamma ray radiation)

. Specific x-rays (i.e., by means of electron beam radiation)

. Sputtering and bombardment

. Secondary electrons

. . Photoelectrons

. Absorption and transmission

. Scattering

. . Back sides and reflection

. Diffraction

. Doppler effect

KK11

KK12

KK13

KK14

. Interference

. . Standing waves

. Resonance

. References to modes

LL00
DEVICES RELATED TO DETECTORS

LL01

LL02

LL03

LL04

LL06

LL08

. References to shapes, structures, materials, and manufacturing methods

. Specific arrangements and directions

. . Straight array configurations

. . Curved array configurations

. Screening of unnecessary particles and wave motions, and detector integrity

. Cable sensors

LL11

LL12

LL13

LL14

LL15

LL16

LL17

LL18

LL19

. Ionization chambers

. GM (i.e., Geiger-Muller) tubes

. Proportional counter tubes

. Scintillation detectors

. Semiconductor radiation beam detectors

. Imaging means (e.g., x-ray televisions and televisions)

. Optoelectronic multiplication tubes

. Photography and other detection means

. Pluralities and combinations of units and types

MM00
SPECTRA

MM01

MM02

MM04

MM06

MM07

. Crystals and lattices

. E and H polarization

. Absorption filters

. Pluralities and combinations of units and types

. Spectra before targeted object injection

NN00
FORMS OF SCANNING

NN01

NN02

NN03

NN04

NN05

NN06

NN07

NN08

NN09

NN10

. Relative movement

. . Movement of targeted objects

. . . Rectilinear movement

. . . Rotational movement

. . Movement of measuring devices

. . . Movement of radiation sources only

. . . Movement of detectors only

. . . Rotational movement

. . . Revolutionary movement

. . . Rectilinear movement

PP00
DEVICES RELATED TO MOUNTING AND TRANSPORT, MAINTENANCE, AND SUPPORT

PP01

PP02

PP03

PP04

PP05

PP07

. References to radiation sources, detector support, and maintenance

. . Deformed frames

. . C-shaped and U-shaped frames

. . O-shaped frames

. . Movement of radiation sources and detectors on frames

. . Traveling vehicles and bodies

PP11

PP12

PP13

PP14

PP15

PP16

PP17

PP19

PP20

. References to maintenance and support of targeted objects

. . Movement tables (XY and XYZ tables)

. . . Rotation only

. . Affixing to rotational shafts

. . Conveyor belts

. . Lines of rollers

. . Use of gravity (e.g., inclination and natural descending)

. References to maintenance and support of standard objects

. . Discoid holders

QQ00
CONTROL

QQ01

QQ02

QQ03

QQ04

QQ06

QQ07

QQ08

QQ09

QQ10

. Parameters for guns, tubes, and radiation sources

. . Deflection

. . Acceleration

. . Frequency

. Spectral system control

. Switchover of display means

. Detection system control

. . Switchover of detection systems

. Control of devices other than measuring devices (e.g., rolling devices)

QQ11

QQ12

QQ13

QQ14

. References to canning control

. . Number of scanning lines and scanning density

. . Scanning speed

. . Control of scanning initialization and scanning ranges

RR00
DEVICES RELATED TO SIGNAL PROCESSING AND POWER SOURCES

RR01

RR02

RR03

RR04

RR05

RR06

RR07

RR08

RR09

. Wave-height differential and selection circuits

. Wave-height analyzers

. Gate methods and (reverse) coincidence counting

. Determination, alteration, and setting of threshold values

. Stabilization circuits

. Devices related to power sources

. Filtering

. Sampling

. Signal delays

RR11

RR12

RR13

RR14

RR15

RR16

RR17

RR18

RR19

RR20

. Devices that convert signals

. . Analog-to-digital (i.e., A/D) conversion, multiple-value coding, and binary coding

. . Digital-to-analog (i.e., D/A) conversion

. . Fourier transform

. . Logarithmic conversion

. . Modulation and detection

. . . Frequency modulation

. . . Phase modulation

. . Integration

. . Differentiation

RR21

RR22

RR24

RR25

RR26

RR27

RR28

RR29

RR30

. Devices that make use of specific values and positions of signals

. . Points of inflection

. Comparison, subtraction, differences, and ratios of signals

. . Amplitude comparison

. . Phase comparison

. Addition and synthesis of signals (i.e., excluding RR40)

. Averaging and smoothing of signals

. Signal memory

. . Image signal memory

RR31

RR32

RR33

RR35

RR36

RR37

RR38

RR39

RR40

. Approximate expressions

. . Interpolation

. . Least square method

. Image processing

. . Contour extraction (e.g., contour exaggeration)

. . Generation of cursor lines, graduation lines, and indices

. . Generation of windows

. . Masking

. . Addition and synthesis of image signals

RR41

RR42

RR44

. Statistical analysis

. . Histograms and frequency distributions

. References to correlations

SS00
INDICATIONS AND RECORDING

SS01

SS02

SS03

SS04

. Content of indications and recording

. . Images of objects to be measured

. . Characters (e.g., letters and numbers)

. . Generation of alarms

SS11

SS12

SS13

SS14

SS15

SS16

SS17

SS18

. Means

. . Optical means

. . . Image displays

. . . . Three-dimensional displays (e.g., stereoscopic methods)

. . . . Brightness and darkness displays

. . Means using printing (e.g., printers and the like)

. . . Printing directly onto the targeted object

. . Sound and voice

TT00
REFERENCES TO PROCESSING AND OPERATIONS ON TARGETED OBJECTS AND STANDARD OBJECTS

TT01

TT02

TT03

TT04

TT05

TT06

TT07

TT08

. References to positioning and position adjustment

. Cleaning and purification

. Thermal processing and operations (i.e., heating and cooling)

. Mechanical processing and operations

. Chemical processing and operations

. Processing and operations before measuring

. Processing and operations during measuring

. Processing and operations after measuring

UU00
FUNCTIONAL ELEMENTS, TECHNICAL MATTERS, AND MICROWAVE CIRCUITS

UU01

UU02

UU03

UU05

UU06

UU07

. Opening means

. . Collimating functions

. . Shutters and diaphragms

. Positioning and adjustment of measuring devices

. Cooling of devices

. Remote measuring (i.e., without or with wires)

UU11

UU12

UU13

UU14

UU15

UU16

UU17

UU18

UU19

UU20

. Microwave circuit devices

. . Waveguides

. . Branch circuits

. . . Directional couplers

. . . Magic tees

. . Non-reversible circuits

. . . Circulators

. . . Isolators

. . Cavity resonators

. . . Cavity wavelength meters

UU22

. . Phase shifters

UU31

UU32

UU33

UU34

UU35

UU36

UU37

UU38

UU39

UU40

. Combinations with measuring means in other fields

. . Optical means for observing surfaces (e.g., microscopes)

. . Displacement meters, distance meters, and position detection

. . Temperature measurement

. . Speed detection

. . Angle and rotation detection

. . Edge detection

. . Ammeters

. . Voltmeters

. . Calorimeters

2F067	Length-measuring devices using wave or particle radiation
	G01B15/00 -15/08