FI (list display)

  • H10B43/00
  • EEPROM devices comprising charge-trapping gate insulators [2023.01] HB CC 5F083
  • H10B43/10
  • . characterised by the top-view layout [2023.01] HB CC 5F083
  • H10B43/20
  • . characterised by three-dimensional arrangements, e.g. with cells on different height levels [2023.01] HB CC 5F083
  • H10B43/23
  • .. with source and drain on different levels, e.g. with sloping channels [2023.01] HB CC 5F083
  • H10B43/27
  • ... the channels comprising vertical portions, e.g. U-shaped channels [2023.01] HB CC 5F083
  • H10B43/30
  • . characterised by the memory core region [2023.01] HB CC 5F083
  • H10B43/35
  • .. with cell select transistors, e.g. NAND [2023.01] HB CC 5F083
  • H10B43/40
  • . characterised by the peripheral circuit region [2023.01] HB CC 5F083
  • H10B43/50
  • . characterised by the boundary region between the core and peripheral circuit regions [2023.01] HB CC 5F083
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