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  • G01R31/00
    		•  Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (testing or measuring semiconductors or solid state devices during manufacture H01L 21/66; testing line transmission systems H04B 3/46) [1, 2006.01] HB CC 2G036
  • G01R31/01
    		•  .Subjecting similar articles in turn to test, e.g. "go/nogo" tests in mass production; Testing objects at points as they pass through a testing station (testing of cables continuously passing the testing apparatus G01R 31/59; testing dielectric strength or breakdown voltage G01R 31/12) [6, 2006.01, 2020.01] HB CC 2G036
  • G01R31/08
    		•  .Locating faults in cables, transmission lines, or networks [1, 2006.01, 2020.01] HB CC 2G033
  • G01R31/10
    		•  ..by increasing destruction at fault, e.g. burning-in by using a pulse generator operating a special programme HB CC 2G033
  • G01R31/11
    		•  ..using pulse-reflection methods HB CC 2G033
  • G01R31/12
    		•  .Testing dielectric strength or breakdown voltage [1, 2006.01, 2020.01] HB CC 2G015
  • G01R31/12@A
    		•  Detecting corona discharges HB CC 2G015
  • G01R31/12@B
    		•  Testing cables HB CC 2G015
  • G01R31/12@C
    		•  Testing insulators HB CC 2G015
  • G01R31/12@D
    		•  Tracking tests HB CC 2G015
  • G01R31/12@Z
    		•  Others HB CC 2G015
  • G01R31/14
    		•  ..Circuits therefor HB CC 2G015
  • G01R31/16
    		•  ..Construction of testing vessels; Electrodes therefor HB CC 2G015
  • G01R31/18
    		•  ..Subjecting similar articles in turn to test, e.g. go/no-go tests in mass production [1, 2006.01] HB CC 2G015
  • G01R31/20
    		•  ..Preparation of articles or specimens to facilitate testing HB CC 2G015
  • G01R31/24
    		•  .Testing of discharge tubes (during manufacture H01J 9/42) [1, 2, 2006.01, 2020.01] HB CC 2G036
  • G01R31/24@A
    		•  Brown tubes or cathode ray tubes HB CC 2G036
  • G01R31/24@B
    		•  .Image receiving tubes HB CC 2G036
  • G01R31/24@C
    		•  Discharge tubes HB CC 2G036
  • G01R31/24@D
    		•  .Fluorescent lights HB CC 2G036
  • G01R31/24@E
    		•  ..Glow starters HB CC 2G036
  • G01R31/24@F
    		•  Microwave tubes (magnetron, progressive wave tube, klystron) HB CC 2G036
  • G01R31/24@G
    		•  Photomultiplier tube, secondary electron multiplier tube, GM tube, X-ray tube) HB CC 2G036
  • G01R31/24@Z
    		•  Others HB CC 2G036
  • G01R31/25
    		•  ..Testing of vacuum tubes [2, 2006.01] HB CC 2G036
  • G01R31/26
    		•  .Testing of individual semiconductor devices (testing or measuring during manufacture or treatment H01L 21/66; testing of photovoltaic devices H02S 50/10) [1, 2, 2006.01, 2014.01, 2020.01] HB CC 2G003
  • G01R31/26@A
    		•  Transistors HB CC 2G003
  • G01R31/26@B
    		•  FET, UJT HB CC 2G003
  • G01R31/26@C
    		•  Diodes HB CC 2G003
  • G01R31/26@D
    		•  Thyristors or TRIAC HB CC 2G003
  • G01R31/26@E
    		•  Charge coupled devices HB CC 2G003
  • G01R31/26@F
    		•  Special elements HB CC 2G003
  • G01R31/26@G
    		•  Integrated circuits HB CC 2G003
  • G01R31/26@H
    		•  Environmental tests HB CC 2G003
  • G01R31/26@J
    		•  Contacting devices for testing probes (measurement probes 1/06) HB CC 2G003
  • G01R31/26@Z
    		•  Others HB CC 2G003
  • G01R31/265
    		•  ..Contactless testing [6, 2006.01] HB CC 2G003
  • G01R31/27
    		•  ..Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects due to surrounding elements [6, 2006.01] HB CC 2G003
  • G01R31/28
    		•  .Testing of electronic circuits, e.g. by signal tracer (testing computers during standby operation or idletime G06F 11/22) [1, 2006.01] HB CC 2G132
  • G01R31/28@A
    		•  Tests of logic circuits HB CC 2G132
  • G01R31/28@B
    		•  .Testing memories, memory circuits HB CC 2G132
  • G01R31/28@C
    		•  Tests of circuits including analog circuits HB CC 2G132
  • G01R31/28@D
    		•  Datum circuits, comparisons with datum data HB CC 2G132
  • G01R31/28@E
    		•  .Inspections by compressed data HB CC 2G132
  • G01R31/28@F
    		•  Testing by simulating HB CC 2G132
  • G01R31/28@G
    		•  Testing by scan-in, scan-out, San-pass HB CC 2G132
  • G01R31/28@H
    		•  Testing arrangements HB CC 2G132
  • G01R31/28@J
    		•  .Fixtures for testing Ics or substrates HB CC 2G132
  • G01R31/28@K
    		•  .Probes (probes in general G 01 R 1/06) HB CC 2G132
  • G01R31/28@L
    		•  ..Contactless probes HB CC 2G132
  • G01R31/28@M
    		•  .Circuits HB CC 2G132
  • G01R31/28@N
    		•  Small checkers HB CC 2G132
  • G01R31/28@P
    		•  Applying signals or voltages HB CC 2G132
  • G01R31/28@Q
    		•  .Generating test signals HB CC 2G132
  • G01R31/28@R
    		•  Detecting signals or voltage HB CC 2G132
  • G01R31/28@S
    		•  Adapters for testing or inspections HB CC 2G132
  • G01R31/28@T
    		•  .Extension boards HB CC 2G132
  • G01R31/28@U
    		•  Structures of test specimens HB CC 2G132
  • G01R31/28@V
    		•  .Circuit configurations HB CC 2G132
  • G01R31/28@W
    		•  ..Switching to test modes HB CC 2G132
  • G01R31/28@X
    		•  Identifying types or existence of test specimens HB CC 2G132
  • G01R31/28@Y
    		•  For testing multiple test specimens HB CC 2G132
  • G01R31/28@Z
    		•  Others HB CC 2G132
  • G01R31/30
    		•  ..Marginal testing, e.g. by varying supply voltage(testing computers during standby operation or idle time G06F 11/22) [1, 2, 2006.01] HB CC 2G132
  • G01R31/302
    		•  ..Contactless testing [5, 2006.01] HB CC 2G132
  • G01R31/303
    		•  ...of integrated circuits (G01R 31/305-G01R 31/315 take precedence) [6, 2006.01] HB CC 2G132
  • G01R31/304
    		•  ...of printed or hybrid circuits (G01R 31/305-G01R 31/315 take precedence) [6, 2006.01] HB CC 2G132
  • G01R31/305
    		•  ...using electron beams [5, 2006.01] HB CC 2G132
  • G01R31/306
    		•  ....of printed or hybrid circuits [6, 2006.01] HB CC 2G132
  • G01R31/307
    		•  ....of integrated circuits [6, 2006.01] HB CC 2G132
  • G01R31/308
    		•  ...using non-ionising electromagnetic radiation,e.g. optical radiation [5, 2006.01] HB CC 2G132
  • G01R31/309
    		•  ....of printed or hybrid circuits [6, 2006.01] HB CC 2G132
  • G01R31/311
    		•  ....of integrated circuits [6, 2006.01] HB CC 2G132
  • G01R31/312
    		•  ...by capacitive methods [5, 2006.01] HB CC 2G132
  • G01R31/315
    		•  ...by inductive methods [5, 2006.01] HB CC 2G132
  • G01R31/316
    		•  ..Testing of analog circuits [6, 2006.01] HB CC 2G132
  • G01R31/3161
    		•  ...Marginal testing [6, 2006.01] HB CC 2G132
  • G01R31/3163
    		•  ...Functional testing [6, 2006.01] HB CC 2G132
  • G01R31/3167
    		•  ..Testing of combined analog and digital circuits [6, 2006.01] HB CC 2G132
  • G01R31/317
    		•  ..Testing of digital circuits [6, 2006.01] HB CC 2G132
  • G01R31/3173
    		•  ...Marginal testing [6, 2006.01] HB CC 2G132
  • G01R31/3177
    		•  ...Testing of logic operation, e.g. by logic analysers [6, 2006.01] HB CC 2G132
  • G01R31/3181
    		•  ...Functional testing (G01R 31/3177 takes precedence) [6, 2006.01] HB CC 2G132
  • G01R31/3183
    		•  ....Generation of test inputs, e.g. test vectors,patterns or sequences [6, 2006.01] HB CC 2G132
  • G01R31/3185
    		•  ....Reconfiguring for testing, e.g. LSSD,partitioning [6, 2006.01] HB CC 2G132
  • G01R31/3187
    		•  ....Built-in tests [6, 2006.01] HB CC 2G132
  • G01R31/319
    		•  ....Tester hardware, i.e. output processing circuits [6, 2006.01] HB CC 2G132
  • G01R31/3193
    		•  .....with comparison between actual response and known fault-freeresponse [6, 2006.01] HB CC 2G132
  • G01R31/327
    		•  .Testing of circuit interrupters, switches or circuit-breakers [6] HB CC 2G116
  • G01R31/333
    		•  ..Testing of the switching capacity of high-voltage circuit-breakers [6] HB CC 2G116
  • G01R31/333@A
    		•  Testing in general HB CC 2G116
  • G01R31/333@B
    		•  synthetic testing or equivalent testing HB CC 2G116
  • G01R31/333@C
    		•  Testing three-phase short-circuits HB CC 2G116
  • G01R31/333@D
    		•  short line fault testing HB CC 2G116
  • G01R31/333@E
    		•  Testing switchgear HB CC 2G116
  • G01R31/333@F
    		•  Testing multi-contacts tank type circut-breakers HB CC 2G116
  • G01R31/333@G
    		•  structural HB CC 2G116
  • G01R31/333@Z
    		•  Others HB CC 2G116
  • G01R31/34
    		•  .Testing dynamo-electric machines [3, 2006.01, 2020.01] HB CC 2G116
  • G01R31/34@A
    		•  By measuring voltage or current HB CC 2G116
  • G01R31/34@B
    		•  By measuring insulation resistance HB CC 2G116
  • G01R31/34@C
    		•  By measuring magnetic flux HB CC 2G116
  • G01R31/34@D
    		•  By measuring discharge HB CC 2G116
  • G01R31/34@E
    		•  By load tests HB CC 2G116
  • G01R31/34@F
    		•  By measuring overall characteristics HB CC 2G116
  • G01R31/34@G
    		•  By measuring vibrations HB CC 2G116
  • G01R31/34@Z
    		•  Others HB CC 2G116
  • G01R31/36
    		•  .Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC] [3, 2006.01, 2019.01, 2020.01] HB CC 2G216
  • G01R31/364
    		•  ..Battery terminal connectors with integrated measuring arrangements HB CC 2G216
  • G01R31/367
    		•  ..Software therefor, e.g. for battery testing using modelling or look-up tables HB CC 2G216
  • G01R31/371
    		•  ..with remote indication, e.g. on external chargers HB CC 2G216
  • G01R31/374
    		•  ..with means for correcting the measurement for temperature or ageing HB CC 2G216
  • G01R31/378
    		•  ..specially adapted for the type of battery or accumulator HB CC 2G216
  • G01R31/379
    		•  ...for lead-acid batteries HB CC 2G216
  • G01R31/382
    		•  ..Arrangements for monitoring battery or accumulator variables, e.g. SoC HB CC 2G216
  • G01R31/3828
    		•  ...using current integration HB CC 2G216
  • G01R31/3832
    		•  ....without measurement of battery voltage HB CC 2G216
  • G01R31/3835
    		•  ...involving only voltage measurements HB CC 2G216
  • G01R31/3842
    		•  ...combining voltage and current measurements HB CC 2G216
  • G01R31/385
    		•  ..Arrangements for measuring battery or accumulator variables (for monitoring G01R31/382) HB CC 2G216
  • G01R31/387
    		•  ...Determining ampere-hour charge capacity or SoC HB CC 2G216
  • G01R31/388
    		•  ....involving voltage measurements HB CC 2G216
  • G01R31/389
    		•  ..Measuring internal impedance, internal conductance or related variables HB CC 2G216
  • G01R31/392
    		•  ..Determining battery ageing or deterioration, e.g. state of health HB CC 2G216
  • G01R31/396
    		•  ..Acquisition or processing of data for testing or for monitoring individual cells or groups of cells within a battery HB CC 2G216
  • G01R31/40
    		•  .Testing power supplies (testing photovoltaic devices H02S 50/10) [6, 2006.01, 2014.01, 2020.01] HB CC 2G036
  • G01R31/42
    		•  ..AC power supplies [6, 2006.01] HB CC 2G036
  • G01R31/44
    		•  .Testing lamps [6, 2006.01, 2020.01] HB CC 2G036
  • G01R31/50
    		•  . Testing of electric apparatus lines cables or components for short-circuits continuity leakage current or incorrect line connections (testing of sparking plugs H01T13/58) HB CC 2G014
  • G01R31/52
    		•  .. Testing for short-circuits leakage current or ground faults HB CC 2G014
  • G01R31/54
    		•  .. Testing for continuity HB CC 2G014
  • G01R31/55
    		•  .. Testing for incorrect line connections HB CC 2G014
  • G01R31/56
    		•  .. Testing of electric apparatus (testing of transformers G01R31/62;testing of connections G01R31/66) HB CC 2G014
  • G01R31/58
    		•  .. Testing of lines cables or conductors (testing of electric windings G01R31/72) HB CC 2G014
  • G01R31/59
    		•  ... while the cable continuously passes the testing apparatus e.g. during manufacture HB CC 2G014
  • G01R31/60
    		•  ... Identification of wires in a multicore cable HB CC 2G014
  • G01R31/62
    		•  .. Testing of transformers HB CC 2G014
  • G01R31/64
    		•  .. Testing of capacitors HB CC 2G014
  • G01R31/66
    		•  .. Testing of connections e.g. of plugs or non-disconnectable joints (testing for incorrect line connections G01R31/55) HB CC 2G014
  • G01R31/67
    		•  ... Testing the correctness of wire connections in electric apparatus or circuits HB CC 2G014
  • G01R31/68
    		•  ... Testing of releasable connections e.g. of terminals mounted on a printed circuit board HB CC 2G014
  • G01R31/69
    		•  .... of terminals at the end of a cable or a wire harness; of plugs; of sockets e.g. wall sockets or power sockets in appliances HB CC 2G014
  • G01R31/70
    		•  ... Testing of connections between components and printed circuit boards (G01R31/68 takes precedence) HB CC 2G014
  • G01R31/71
    		•  .... Testing of solder joints HB CC 2G014
  • G01R31/72
    		•  .. Testing of electric windings (testing of transformers G01R31/62) HB CC 2G014
  • G01R31/74
    		•  .. Testing of fuses HB CC 2G014
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