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This page displays all 「FI」 in main group H01J49/00. |
HB:Handbook | ||||
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CC:Concordance | |||||
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Particle spectrometers or separator tubes [3, 2006.01] | HB | CC | 5C038 | |
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.Imaging particle spectrometry | HB | CC | 5C038 | |
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.Calibration of the apparatus | HB | CC | 5C038 | |
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.Miniaturised spectrometers, e.g. having smaller than usual scale, integrated conventional components | HB | CC | 5C038 | |
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..Microminiaturised spectrometers, e.g. chip-integrated devices, MicroElectro-Mechanical Systems [MEMS] | HB | CC | 5C038 | |
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.Portable spectrometers, e.g. devices comprising independent power supply, constructional details relating to portability (small scale devices per seH01J49/00,130 and H01J49/00,180) | HB | CC | 5C038 | |
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.Methods for using particle spectrometers | HB | CC | 5C038 | |
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..Step by step routines describing the use of the apparatus (H01J49/00,810 takes precedence) | HB | CC | 5C038 | |
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..Step by step routines describing the handling of the data generated during a measurement (recognising patterns in signals ) | HB | CC | 5C038 | |
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.Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn | HB | CC | 5C038 | |
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..characterised by the fragmentation or other specific reaction | HB | CC | 5C038 | |
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...by collision with gas, e.g. by introducing gas or by accelerating ions with an electric field | HB | CC | 5C038 | |
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...by an electron beam, e.g. electron impact dissociation, electron capture dissociation | HB | CC | 5C038 | |
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...by a photon beam, photo-dissociation | HB | CC | 5C038 | |
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...by applying a resonant excitation voltage | HB | CC | 5C038 | |
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...by collision with a surface, e.g. surface induced dissociation | HB | CC | 5C038 | |
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...by ion/ion reaction, e.g. electron transfer dissociation, proton transfer dissociation | HB | CC | 5C038 | |
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...specific reactions other than fragmentation | HB | CC | 5C038 | |
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..Tandem in time, i.e. using a single spectrometer | HB | CC | 5C038 | |
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..Accelerator mass spectrometers | HB | CC | 5C038 | |
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..Spectrometers having multiple channels, parallel analysis | HB | CC | 5C038 | |
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.Particular arrangements for generating, introducing or analyzing both positive and negative analyte ions (ion/ion reactions H01J49/00,720) | HB | CC | 5C038 | |
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.Details [3] | HB | CC | 5C038 | |
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..Circuit arrangements, e.g. for generating deviation currents or voltages | HB | CC | 5C038 | |
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..Detectors specially adapted to particle spectrometers (data acquisition H01J49/00,360) | HB | CC | 5C038 | |
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...detecting image current induced by the movement of charged particles | HB | CC | 5C038 | |
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..Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components [3] | HB | CC | 5C038 | |
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...Capillaries used for transferring samples or ions (electrospray nozzles H01J49/16,700) | HB | CC | 5C038 | |
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...Sample holders or containers | HB | CC | 5C038 | |
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....for automated handling | HB | CC | 5C038 | |
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....for laser desorption, e.g. matrix-assisted laser desorption/ionisation [MALDI], surface enhanced laser desorption/ionisation [SELDI] plates | HB | CC | 5C038 | |
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...for gaseous samples | HB | CC | 5C038 | |
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....using a membrane permeable to gases | HB | CC | 5C038 | |
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...for liquid samples | HB | CC | 5C038 | |
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....using a membrane permeable to liquids | HB | CC | 5C038 | |
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....with means for preventing droplets from entering the analyzer; Desolvation of droplets | HB | CC | 5C038 | |
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....with means for introducing as a spray, a jet or an aerosol (electrospray ion sources H01J49/16,500) | HB | CC | 5C038 | |
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.....with means for using a nebulising gas, i.e. pneumatically assisted | HB | CC | 5C038 | |
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....with means for vaporising using mechanical energy, e.g. by ultrasonic vibrations | HB | CC | 5C038 | |
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...for solid samples | HB | CC | 5C038 | |
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....Desorption by laser or particle beam, followed by ionisation as a separate step (sample holder per se H01J49/0418) | HB | CC | 5C038 | |
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...with means for heating or cooling the sample | HB | CC | 5C038 | |
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....with means for pyrolysis | HB | CC | 5C038 | |
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....using high-temperature fluid | HB | CC | 5C038 | |
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....with means for collisional cooling | HB | CC | 5C038 | |
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....with means for monitoring the sample temperature | HB | CC | 5C038 | |
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....with means for applying heat to desorb the sample; Evaporation | HB | CC | 5C038 | |
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...Vacuum locks; Valves | HB | CC | 5C038 | |
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..Electron- or ion-optical arrangements (H01J 49/04 takes precedence) [3] | HB | CC | 5C038 | |
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...Ion deflecting means, e.g. ion gates | HB | CC | 5C038 | |
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...Ion guides (linear ion traps performing mass selection H01J49/42,250, mass filters H01J49/42,100) | HB | CC | 5C038 | |
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....Multipole ion guides, e.g. quadrupoles, hexapoles | HB | CC | 5C038 | |
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....having stacked electrodes, e.g. ring stack, plate stack | HB | CC | 5C038 | |
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.....Ion funnels | HB | CC | 5C038 | |
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...Ion lenses, apertures, skimmers | HB | CC | 5C038 | |
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...Mounting, supporting, spacing, or insulating electrodes | HB | CC | 5C038 | |
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..Electron sources, e.g. for generating photo-electrons, secondary electrons or Auger electrons [3] | HB | CC | 5C038 | |
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..Ion sources; Ion guns [3] | HB | CC | 5C038 | |
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...using reflex discharge, e.g. Penning ion sources | HB | CC | 5C038 | |
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...using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP] | HB | CC | 5C038 | |
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...Arrangements for using several ion sources | HB | CC | 5C038 | |
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... using an arc discharge e.g. of the duoplasmatron type | HB | CC | 5C038 | |
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....Duoplasmatrons | HB | CC | 5C038 | |
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....Other arc discharge ion sources using an applied magnetic field | HB | CC | 5C038 | |
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...using particle bombardment, e.g. ionisation chambers [3] | HB | CC | 5C038 | |
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....using a solid target which is not previously vapourised | HB | CC | 5C038 | |
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....using chemical ionisation | HB | CC | 5C038 | |
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....with electrons, e.g. electron impact ionisation, electron attachment (H01J49/14,500 takes precedence) | HB | CC | 5C038 | |
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...using surface ionisation, e.g. field-, thermionic- or photo-emission [3] | HB | CC | 5C038 | |
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....using photoionisation, e.g. by laser | HB | CC | 5C038 | |
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.....Direct photo-ionisation, e.g. single photon or multi-photon ionisation | HB | CC | 5C038 | |
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.....Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI] (sample holders H01J49/04,180) | HB | CC | 5C038 | |
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....Electrospray ionisation | HB | CC | 5C038 | |
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.....Capillaries and nozzles specially adapted therefor | HB | CC | 5C038 | |
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....field ionisation, e.g. corona discharge | HB | CC | 5C038 | |
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...using spark ionisation [3] | HB | CC | 5C038 | |
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..Magnetic deflection [3] | HB | CC | 5C038 | |
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..Electrostatic deflection [3] | HB | CC | 5C038 | |
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..Vacuum systems, e.g. maintaining desired pressures [3] | HB | CC | 5C038 | |
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.Mass spectrometers or separator tubes [3, 2006.01] | HB | CC | 5C038 | |
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..Static spectrometers [3, 2006.01] | HB | CC | 5C038 | |
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...using electrostatic analysers | HB | CC | 5C038 | |
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...using electrostatic and magnetic sectors with simple focusing, e.g. with parallel fields such as Aston spectrometer | HB | CC | 5C038 | |
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....with energy analysis, e.g. Castaing filter | HB | CC | 5C038 | |
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.....using crossed electric and magnetic fields perpendicular to the beam, e.g. Wien filter | HB | CC | 5C038 | |
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...using magnetic analysers [3] | HB | CC | 5C038 | |
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....with several sectors in tandem | HB | CC | 5C038 | |
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...using double focusing [3] | HB | CC | 5C038 | |
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....with a magnetic sector of 90 degrees, e.g. Mattauch-Herzog type | HB | CC | 5C038 | |
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....with an electrostatic section of 90 degrees, e.g. Nier-Johnson type | HB | CC | 5C038 | |
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....with magnetic and electrostatic sectors of 90 degrees | HB | CC | 5C038 | |
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....with a cycloidal trajectory by using crossed electric and magnetic fields, e.g. trochoidal type | HB | CC | 5C038 | |
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..Dynamic spectrometers [3, 2006.01] | HB | CC | 5C038 | |
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...Radio frequency spectrometers, e.g. Bennetttype spectrometers; Redhead-type spectrometers [3, 2006.01] | HB | CC | 5C038 | |
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....Omegatrons [3] | HB | CC | 5C038 | |
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...Time-of-flight spectrometers (H01J 49/36 takes precedence) [3, 2006.01] | HB | CC | 5C038 | |
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....characterised by orthogonal acceleration, e.g. focusing or selecting the ions, pusher electrode | HB | CC | 5C038 | |
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....characterised by the acceleration optics and/or the extraction fields | HB | CC | 5C038 | |
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....characterised by the reflectron, e.g. curved field, electrode shapes | HB | CC | 5C038 | |
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....with multiple reflections (electrostatic traps H01J49/42,450) | HB | CC | 5C038 | |
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....with multiple changes of direction, e.g. by using electric or magnetic sectors, closed-loop time-of-flight | HB | CC | 5C038 | |
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...Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons [3, 2006.01] | HB | CC | 5C038 | |
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....Device types | HB | CC | 5C038 | |
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.....Mass filters, i.e. deviating unwanted ions without trapping | HB | CC | 5C038 | |
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......Quadrupole mass filters (H01J49/42,250 takes precedence) | HB | CC | 5C038 | |
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.....Two-dimensional RF ion traps (ion guides not accompanied by mass selection H01J49/06,200) | HB | CC | 5C038 | |
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......Multipole linear ion traps, e.g. quadrupoles, hexapoles | HB | CC | 5C038 | |
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......with radial ejection | HB | CC | 5C038 | |
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......Stacked rings or stacked plates | HB | CC | 5C038 | |
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.....Three-dimensional ion traps, i.e. ion traps composed of end caps and ring electrodes | HB | CC | 5C038 | |
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.....Electrostatic ion traps (H01J49/42,200 takes precedence; MR-TOF analyzer H01J49/40,600) | HB | CC | 5C038 | |
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......with a logarithmic radial electric potential, e.g. orbitraps | HB | CC | 5C038 | |
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.....with particular constructional features | HB | CC | 5C038 | |
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....Methods for controlling ions | HB | CC | 5C038 | |
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.....Controlling the number of trapped ions, preventing space charge effects | HB | CC | 5C038 | |
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.....Ejection and selection methods | HB | CC | 5C038 | |
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......Applying a non-resonant auxiliary oscillating voltage, e.g. parametric excitation | HB | CC | 5C038 | |
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......Applying a notched broadband signal | HB | CC | 5C038 | |
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......Applying a resonant signal, e.g. selective resonant ejection matching the secular frequency of ions (H01J49/42,900, H01J49/42,800 take precedence) | HB | CC | 5C038 | |
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......Scanning an electric parameter, e.g. voltage amplitude or frequency | HB | CC | 5C038 | |
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.....Storage methods | HB | CC | 5C038 | |
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.Energy spectrometers, e.g. alpha-, betaspectrometers [3, 2006.01] | HB | CC | 5C038 | |
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..Dynamic spectrometers | HB | CC | 5C038 | |
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...Time-of-flight spectrometers | HB | CC | 5C038 | |
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..Static spectrometers [3, 2006.01] | HB | CC | 5C038 | |
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...using static magnetic fields | HB | CC | 5C038 | |
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...using crossed electric and magnetic fields perpendicular to the beam, e.g. Wien filter (see also H01J49/28,800) | HB | CC | 5C038 | |
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...using electrostatic analysers, e.g. cylindrical sector, Wien filter [3] | HB | CC | 5C038 | |
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....with cylindrical mirrors | HB | CC | 5C038 | |
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....with spherical mirrors | HB | CC | 5C038 | |
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....with plane mirrors, i.e. uniform field | HB | CC | 5C038 | |
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....with retarding grids | HB | CC | 5C038 | |