F-Term-List

H01J41/12;41/14;41/16;41/18;41/20

AA00
ION PUMPS

AA01

AA02

AA03

AA04

AA05

AA06

AA07

AA09

AA10

. Electrodes

. . Anodes

. . Cathodes

. Magnetic circuits

. Vessels

. Circuit devices

. Getter materials

. Getter-ion pumps

. Sputter-ion pumps

AA11

AA12

AA14

. Purification and activation

. Combinations of pumps and other devices

. Others

H01J43/24

BB00
SECONDARY ELECTRON DISCHARGE ELECTRODES

BB01

BB02

BB03

BB04

BB06

BB07

BB09

. Electrodes

. . Dynodes

. Output sections

. Vessels

. Vessels for channel plates

. Electrodes for measurement

. Others

H01J47/00

CC00
RADIATION PARTICLE SENSORS

CC01

CC02

CC03

CC04

CC06

. Ionization chambers

. Proportional counter tubes

. Geiger-Muller counter tubes

. Neutron-detection tubes

. Others

H01J47/02;47/04;47/06

DD00
IONIZATION CHAMBERS AND PROPORTIONAL COUNTER TUBES

DD01

DD02

DD03

DD04

DD05

DD06

DD07

DD08

DD09

DD10

. Electrodes

. . Anodes

. . Cathodes

. Vessels

. . Incident windows

. Spacers

. . Attachment of electrodes to spacers

. Output end sections

. Circuit devices

. Gas-charging for ionization

DD12

DD13

DD15

. X-ray computer tomography

. Multiple channels

. Others

H01J49/04

EE00
FORMS OF SAMPLES

EE01

EE02

EE03

. Gases

. Liquids

. Solids

EF00
SAMPLE INTRODUCTION, HOLDING, AND THE LIKE

EF01

EF02

EF03

EF04

EF05

EF07

EF09

. Sample-introducion means

. . Introduction of tubes

. . . Variants that use injection or spraying

. . . Variants that use fogging or misting

. . . Variants that use dripping

. . Introduction of rods or probes

. . Injection needles

EF11

EF12

EF14

EF15

EF16

EF17

EF18

EF19

. . Separators

. . Valves or shield plates

. Sample-holding means

. . Mounting

. . Adhesion or adsorption

. . Coating

. . Fixing

. . Impregnation

EF21

EF22

EF23

EF25

EF26

EF27

EF29

. . Sample trays

. . Sample containers

. . Pipettes

. Sample-processing means

. . Heating

. . Cooling

. Sample-replacing means

EF31

EF33

. Sample-position-adjustment means

. Others

H01J49/06

FF00
ELECTRON AND ION OPTICAL APPARATUSES

FF01

FF03

FF04

FF05

FF07

FF08

FF10

. Slits

. Sensors or collectors

. . Ion sensors

. . Electron sensors

. Electrostatic lenses

. Magnetic field lenses

. Electrostatic deflection

FF11

FF13

. Magnetic field deflection

. Others

H01J49/10;49/14;49/16

GG00
TYPES OF ION SOURCES

GG01

GG02

GG03

GG04

GG05

GG06

GG07

GG08

GG09

. Electron-bombardment ion sources (EI)

. Ion-bombardment ion sources

. Neutron-bombardment ion sources

. Field-detach ion sources (FD)

. Molten-metal ion sources (e.g., electron-hole droplets [EHD])

. Chemical ion sources (CI)

. Photo or laser ion sources (PI)

. Atmospheric-pressure ion sources (API)

. Induction-coupled plasma ion sources (ICP)

GG11

GG13

. Duplex ion sources (i.e., shared ion sources)

. Others

GH00
ION SOURCE STRUCTURE

GH01

GH02

GH03

GH04

GH05

GH06

GH08

GH09

GH10

. Ionization chambers

. . Ionization boxes

. . Sample-introduction sections

. . . Use of gas samples

. . . Use of liquid samples

. . . Use of solid samples

. . Sections for introducing gases other than samples

. . Particle-generating sections

. . Laser light sources

GH11

GH12

GH13

GH15

GH17

. . Electrode sections

. . Magnetic-pole sections

. . Ion-exit sections

. Power sources or controllers

. Others

H01J49/02;49/26;49/28;49/30;49/32

HH00
MASS SPECTROMETRY

HH01

HH02

HH03

HH05

HH06

HH07

HH08

HH09

. Analyzing devices

. . Ion sources

. . . Sample-introduction sections

. . Analysis sections

. . . Single-flux types

. . . . Magnetic-field spectrographs

. . . . Toroidal spectrographs

. . . . Cylindrical spectrographs

HH11

HH12

HH13

HH15

HH16

HH18

HH19

. . . Double-flux types (i.e., two magnetic fields positioned in series)

. . . . Spectrographs primarily using magnetic fields

. . . . Spectrograph primarily using electric fields

. . . Superimposed-field spectrographs

. . . Quadrupole spectrographs

. . Detection sections

. . . Use of secondary electron multipliers

HH21

HH22

HH23

HH24

HH26

HH28

HH30

. . Indication and recording sections

. . . Use of photographic dry plates

. . . Use of cathode-ray tubes

. . . . Markers

. . Power sources or control sections

. Methods of analysis

. Others

H01J49/42

JJ00
STABLE-SCANNING MASS SPECTROMETRY

JJ01

JJ02

JJ04

JJ05

JJ06

JJ07

JJ09

. Analyzing devices

. . Sections before the analyzing sections

. . Analyzing sections

. . . Spectrographs

. . . . Quadrupole spectrographs

. . . Power sources or controllers

. . Sections after the analyzing sections

JJ11

JJ13

. Methods of analysis

. Others

H01J49/44;49/46;49/48

KK00
ENERGY ANALYSIS

KK01

KK02

KK04

KK05

KK06

KK07

KK08

KK09

KK10

. Analyzing devices

. . Particle-generating sections

. . Analyzing sections

. . . Deflecting types

. . . . Electric-field types

. . . . . Spherical-surface spectrographs

. . . . . Cylindrical-mirror-surface spectrographs

. . . . . Parallel-plate spectrographs

. . . . . Power sources or controllers

KK12

KK13

KK15

KK17

KK18

KK20

. . . . Magnetic-field types

. . . . Superimposed-field types

. . . Blocked-electric-field types

. . Detecting sections

. . Indication or recording sections

. Methods of analysis

KK22

. Others