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  • G01Q60/00
    		•  Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof [2010.01] HB CC 2G580
  • G01Q60/00,101
    		•  .probe characteristics HB CC 2G580
  • G01Q60/02
    		•  .Multiple-type SPM, i.e. involving two or more SPM techniques [2010.01] HB CC 2G580
  • G01Q60/04
    		•  ..STM [Scanning Tunnelling Microscopy] combined with AFM [Atomic Force Microscopy] [2010.01] HB CC 2G580
  • G01Q60/06
    		•  ..SNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy] [2010.01] HB CC 2G580
  • G01Q60/08
    		•  ..MFM [Magnetic Force Microscopy] combined with AFM [Atomic Force Microscopy] [2010.01] HB CC 2G580
  • G01Q60/10
    		•  .STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes [2010.01] HB CC 2G580
  • G01Q60/12
    		•  ..STS [Scanning Tunnelling Spectroscopy] [2010.01] HB CC 2G580
  • G01Q60/14
    		•  ..STP [Scanning Tunnelling Potentiometry] [2010.01] HB CC 2G580
  • G01Q60/16
    		•  ..Probes, their manufacture or their related instrumentation, e.g. holders [2010.01] HB CC 2G580
  • G01Q60/16,101
    		•  ...probe characteristics HB CC 2G580
  • G01Q60/16,111
    		•  ...probe manufacture HB CC 2G580
  • G01Q60/18
    		•  .SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes [2010.01] HB CC 2G580
  • G01Q60/20
    		•  ..Fluorescence [2010.01] HB CC 2G580
  • G01Q60/22
    		•  ..Probes, their manufacture or their related instrumentation, e.g. holders [2010.01] HB CC 2G580
  • G01Q60/22,101
    		•  ...probe characteristics HB CC 2G580
  • G01Q60/22,111
    		•  ...probe manufacture HB CC 2G580
  • G01Q60/24
    		•  .AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes [2010.01] HB CC 2G580
  • G01Q60/26
    		•  ..Friction force microscopy [2010.01] HB CC 2G580
  • G01Q60/28
    		•  ..Adhesion force microscopy [2010.01] HB CC 2G580
  • G01Q60/30
    		•  ..Scanning potential microscopy [2010.01] HB CC 2G580
  • G01Q60/32
    		•  ..AC mode [2010.01] HB CC 2G580
  • G01Q60/34
    		•  ...Tapping mode [2010.01] HB CC 2G580
  • G01Q60/36
    		•  ..DC mode [2010.01] HB CC 2G580
  • G01Q60/38
    		•  ..Probes, their manufacture or their related instrumentation, e.g. holders [2010.01] HB CC 2G580
  • G01Q60/38,101
    		•  ...probe characteristics HB CC 2G580
  • G01Q60/38,111
    		•  ...probe manufacture HB CC 2G580
  • G01Q60/40
    		•  ...Conductive probes [2010.01] HB CC 2G580
  • G01Q60/42
    		•  ...Functionalisation [2010.01] HB CC 2G580
  • G01Q60/44
    		•  .SICM [Scanning Ion-Conductance Microscopy] or apparatus therefor, e.g. SICM probes [2010.01] HB CC 2G580
  • G01Q60/44,101
    		•  ..probes, their manufacture or their related instrumentation, e.g. holders HB CC 2G580
  • G01Q60/46
    		•  .SCM [Scanning Capacitance Microscopy] or apparatus therefor, e.g. SCM probes [2010.01] HB CC 2G580
  • G01Q60/48
    		•  ..Probes, their manufacture or their related instrumentation, e.g. holders [2010.01] HB CC 2G580
  • G01Q60/50
    		•  .MFM [Magnetic Force Microscopy] or apparatus therefor, e.g. MFM probes [2010.01] HB CC 2G580
  • G01Q60/52
    		•  ..Resonance [2010.01] HB CC 2G580
  • G01Q60/54
    		•  ..Probes, their manufacture or their related instrumentation, e.g. holders [2010.01] HB CC 2G580
  • G01Q60/54,101
    		•  ...probe characteristics HB CC 2G580
  • G01Q60/54,111
    		•  ...probe manufacture HB CC 2G580
  • G01Q60/56
    		•  ...Probes with magnetic coating [2010.01] HB CC 2G580
  • G01Q60/58
    		•  .SThM [Scanning Thermal Microscopy] or apparatus therefor, e.g. SThM probes [2010.01] HB CC 2G580
  • G01Q60/60
    		•  .SECM [Scanning Electro-Chemical Microscopy] or apparatus therefor, e.g. SECM probes [2010.01] HB CC 2G580
  • G01Q60/60,101
    		•  ..Probes, their manufacture or their related instrumentation, e.g. holders HB CC 2G580
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