|
This page displays all 「FI」 in main group G01Q30/00. |
HB:Handbook | ||||
|
CC:Concordance | |||||
|
|
Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices [2010.01] | HB | CC | 2G580 | |
|
|
.Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope [2010.01] | HB | CC | 2G580 | |
|
|
.Display or data processing devices [2010.01] | HB | CC | 2G580 | |
|
|
..for error compensation [2010.01] | HB | CC | 2G580 | |
|
|
.Means for establishing or regulating a desired environmental condition within a sample chamber [2010.01] | HB | CC | 2G580 | |
|
|
..Thermal environment [2010.01] | HB | CC | 2G580 | |
|
|
..Fluid environment [2010.01] | HB | CC | 2G580 | |
|
|
...Liquid environment [2010.01] | HB | CC | 2G580 | |
|
|
..Vacuum environment [2010.01] | HB | CC | 2G580 | |
|
|
.Means for protecting or isolating the interior of a sample chamber from external environmental conditions or influences, e.g. vibrations or electromagnetic fields [2010.01] | HB | CC | 2G580 | |
|
|
.Sample handling devices or methods [2010.01] | HB | CC | 2G580 | |