This page displays all 「FI」 in main group G01R1/00. |
HB:Handbook | ||||
CC:Concordance |
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Details of instruments or arrangements of the types covered by groups G01R 5/00-G01R 13/00or G01R 31/00 (constructional details particular to electromechanical arrangements for measuring the electric consumption G01R 11/02) [3,8] | HB | CC | 2G034 | |
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.General constructional details | HB | CC | 2G034 | |
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..Housings; Supporting members; Arrangements of terminals | HB | CC | 2G034 | |
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Terminal devices (terminals, connectors, adapters of measuring instruments) | HB | CC | 2G034 | |
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Housings (instrument boxes, cases, covers, waterproof or dustproof mechanisms) | HB | CC | 2G034 | |
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.Overall structures of instruments with housing | HB | CC | 2G034 | |
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.Drawer type instruments | HB | CC | 2G034 | |
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.Adjusting instruments angles | HB | CC | 2G034 | |
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.Instruments with accessories such as thermometers | HB | CC | 2G034 | |
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Supporting members (structural mounting of measurement instruments, instrument structures without housing) | HB | CC | 2G034 | |
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Others | HB | CC | 2G034 | |
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..Measuring leads; Measuring probes () [3] | HB | CC | 2G011 | |
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Electrical connectors for probes (adapters, connectors) | HB | CC | 2G011 | |
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.Test terminals | HB | CC | 2G011 | |
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Supporting members of probes | HB | CC | 2G011 | |
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Probes characterised by detecting devices | HB | CC | 2G011 | |
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Special probes (those not covered by 1/067 or 1/073, e.g. capacitance types, electrode types) | HB | CC | 2G011 | |
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Lead wires for measurements (cables) | HB | CC | 2G011 | |
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Others | HB | CC | 2G011 | |
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...Measuring probes [3] | HB | CC | 2G011 | |
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Single contact types | HB | CC | 2G011 | |
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Multi-contact types | HB | CC | 2G011 | |
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Spring types | HB | CC | 2G011 | |
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Built-in electric components | HB | CC | 2G011 | |
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Hook types | HB | CC | 2G011 | |
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Clip types (pinching types) | HB | CC | 2G011 | |
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Contact needle types (single needle for probe cards) | HB | CC | 2G011 | |
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Insulation coating (shield) | HB | CC | 2G011 | |
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Conductive coating | HB | CC | 2G011 | |
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Folding, positioning | HB | CC | 2G011 | |
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Spherical or rotating types | HB | CC | 2G011 | |
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Conductive needle types | HB | CC | 2G011 | |
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Holding types (pistol types) | HB | CC | 2G011 | |
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Suction plates or magnets | HB | CC | 2G011 | |
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Others | HB | CC | 2G011 | |
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....Non contact-making probes [6] | HB | CC | 2G011 | |
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....Multiple probes [3] | HB | CC | 2G011 | |
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Double needle types | HB | CC | 2G011 | |
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Clip types (pinching types) and for IC lead pins (socket types) | HB | CC | 2G011 | |
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Conductive needle types | HB | CC | 2G011 | |
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Array types (matrix types) | HB | CC | 2G011 | |
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Probe cards | HB | CC | 2G011 | |
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Special probes | HB | CC | 2G011 | |
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Others | HB | CC | 2G011 | |
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.. Pointers; Scales; Scale illumination | HB | CC | 2G034 | |
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In general (Indications other than pointers 13/00) | HB | CC | 2G034 | |
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Pointers (locking or mounting of pointers) | HB | CC | 2G034 | |
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Scales | HB | CC | 2G034 | |
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Scale illumination | HB | CC | 2G034 | |
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Others | HB | CC | 2G034 | |
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..Arrangements of bearings | HB | CC | 2G034 | |
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...of strip or wire bearings | HB | CC | 2G034 | |
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For stretched band type instruments | HB | CC | 2G034 | |
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For instruments of moving coil types (moving magnets) | HB | CC | 2G034 | |
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Others | HB | CC | 2G034 | |
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..Braking arrangements; Damping arrangements | HB | CC | 2G034 | |
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..Magnets | HB | CC | 2G034 | |
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..Screening arrangements against electric or magnetic fields, e.g. against earth's field | HB | CC | 2G034 | |
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.Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments | HB | CC | 2G034 | |
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..Tong testers acting as secondary windings of current transformers | HB | CC | 2G034 | |
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Clamping (clipping type) ammeters (overalls structures of pinching devices, shield) | HB | CC | 2G034 | |
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.Switching mechanisms | HB | CC | 2G034 | |
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.Detecting elements and core arrangements | HB | CC | 2G034 | |
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Signal processing | HB | CC | 2G034 | |
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Others | HB | CC | 2G034 | |
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..Transmission-line, e.g. waveguide, measuring sections, e.g. slotted section | HB | CC | 2G034 | |
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...with linear movement of probe | HB | CC | 2G034 | |
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.Provision in measuring instruments for reference values, e.g. standard voltage, standard waveform | HB | CC | 2G034 | |
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.Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier | HB | CC | 2G034 | |
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.Overload-protection arrangements or circuits for electric measuring instruments | HB | CC | 2G034 | |
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.Arrangements for altering the indicating characteristic, e.g. by modifying the air gap | HB | CC | 2G034 | |
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.Modifications of instruments to indicate the maximum or the minimum value reached in a time interval, e.g. by maximum indicator pointer [3] | HB | CC | 2G034 | |
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..thermally operated | HB | CC | 2G034 | |
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.Modifications of instruments for temperature compensation [2] | HB | CC | 2G034 | |