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This page displays all 「FI」 in main group G01Q70/00. |
HB:Handbook | ||||
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CC:Concordance | |||||
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General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q 60/00 [2010.01] | HB | CC | 2G580 | |
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.Probe holders [2010.01] | HB | CC | 2G580 | |
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..with compensation for temperature or vibration induced errors [2010.01] | HB | CC | 2G580 | |
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.Probe tip arrays [2010.01] | HB | CC | 2G580 | |
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.Probe characteristics [2010.01] | HB | CC | 2G580 | |
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..Shape or taper [2010.01] | HB | CC | 2G580 | |
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...Nano-tube tips [2010.01] | HB | CC | 2G580 | |
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..Particular materials [2010.01] | HB | CC | 2G580 | |
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.Probe manufacture [2010.01] | HB | CC | 2G580 | |
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..Functionalisation [2010.01] | HB | CC | 2G580 | |