F-Term-List

5F053 Liquid deposition of substances of which semiconductor devices are composed
H01L21/208 -21/208@Z;21/368-21/368@Z
H01L21/208-21/208@Z;21/368-21/368@Z AA AA00
GROWING METHODS
AA01 AA02 AA03 AA04 AA05 AA06 AA07 AA08 AA09
. Sliding . Tilting (e.g., Nelson's technique, tipping) . Dipping . Langmuir-Blodgett's (LB) technique . . Perpendicular immersion (LB technique) . Spinning . Boat techniques . . Horizontal or lateral Bridgeman technique . . Gradient freezing technique (GF technique)
AA11 AA12 AA13 AA14 AA15 AA16 AA17 AA18 AA19
. Vertical or longitudinal Bridgeman technique . Lift method (i.e., Czochralski method) . . Revolving of the seed crystals and the melt with relation to one another . . Charging of a magnetic field . . Pulling of sheet-like material . Zone melting . . Temperature gradient zone melting (TGZM) . . Zone melt leveling . . Floating zone melting
AA21 AA22 AA23 AA24 AA25 AA26
. Methods of controlling, regulating, monitoring, and measuring growth . . Methods of controlling and regulating temperature . . . Time series temperature control . . . . Variants for forced inversion of pn-junctions . . . . Gradual cooling or heat reduction techniques . . . . . Temperature reducing procedures
AA32 AA33 AA34 AA35 AA36
. . . Variants that use differences in temperature at multiple locations . . . . Temperature difference methods, temperature gradient methods, and temperature slope methods . . . . Traveling zones . . . . Three-temperature methods . . . . Two-temperature methods
AA42 AA43 AA44 AA45 AA46 AA47 AA48 AA49 AA50
. . Monitoring and measurement . . Object of control or regulation . . . Melts . . . . Melt concentration . . . Ingots or bulk substances . . . Growth substrates . . Methods of controlling and regulating environment . . Sequential control methods . Others
BB BB00
GROWTH APPARATUSES
BB01 BB02 BB03 BB04 BB05 BB06 BB08 BB09
. Growth containers . . Forms . . . Boats . . . Crucibles . . . Reaction tubes . . . . Closed tubes or ampoules . . . Variants having rotating mechanisms . . . Coatings
BB12 BB13 BB14 BB15
. . Materials and material properties . . . Quartz . . . Carbon . . . Graphite
BB21 BB22 BB23 BB24 BB25 BB26 BB27 BB28 BB29
. Melts and apparatuses associated therewith . . Separation of unwanted portions from melts . . Distribution of melts . . Melts of other than growth materials . . . Dummy melts . . Multiple types of melts placed side-by-side . . Variants having melt pressure means . . . Variants that lift melts . . . Extrusion of pre-treatment melts using after-treatment melts
BB32 BB33 BB34 BB35 BB36 BB38 BB39
. . Melt reservoirs . . . Side walls . . . Covers . . . . Sealing with liquids (e.g., liquid encapsulated Czochralski method) . . . Waste liquid reservoirs . . Feeding or replenishing of materials to melts . . Variants in which each melt moves independently
BB41 BB42 BB43 BB44 BB45 BB48
. Growth substrate handling apparatuses . . Relative movement of substrates and melts by sliding . . . Sliders . . . Variants having multiple sections that move relative to each other . . . Variants with relative movement around a circumference . . Variants in which only partitions slide
BB52 BB53 BB54 BB55 BB57 BB58 BB59 BB60
. . Variants that accommodate multiple growth substrates simultaneously . . Variants in which growth substrates are disposed in multiple layers . . Variants in which growth substrates are not situated horizontally . . Equipment to protect growth substrates . Apparatuses that add vapor phase component substances or dopants . Heaters . Doping devices . Others
DD DD00
GROWTH SUBSTANCES
DD01 DD02 DD03 DD04 DD05 DD06 DD07 DD08 DD09
. Si . SiC . GaAs . GaAsP . GaAlAs . GaAlAsP . GaP . GaInP . GaInSb
DD11 DD12 DD13 DD14 DD15 DD16 DD17 DD18 DD19 DD20
. InP . InGaAsP . CdSiP . CdTe . HgCdTe . ZnSe . PbSe . BN . Organic substances . Others
FF FF00
FORMS OF GROWTH
FF01 FF02 FF04 FF05 FF10
. Thin films . . Multi-layer films . Ingots or bulk substances . . Wafers or plate-like bodies . Others
GG GG00
CIRCUMSTANCES OF GROWTH
GG01 GG02 GG03 GG05 GG06 GG10
. Monocrystal or epitaxial growth . Polycrystals . Amorphous materials (i.e., non-crystalline) . Selective growth . . Masks . Others
HH HH00
SUBSTRATES
HH01 HH02 HH04 HH05 HH07 HH10
. Wafers . Band-like bodies and webs . Semiconductor growth substrates . Growth substrates other than semiconductors . Dummy substrates . Others
JJ JJ00
CONDUCTIVE TYPES OF THE PORTIONS GROWN
JJ01 JJ03 JJ10
. p-types . n-types . Others
KK KK00
DOPANTS
KK01 KK02 KK03 KK04 KK05 KK06 KK07 KK08 KK10
. Silicon (Si) . Germanium (Ge) . Boron (B) . Zinc (Zn) . Lithium (Li) . Sulfur (S) . Carbon (C) . Tellurium (Te) . Others
LL LL00
APPLICABLE DEVICES
LL01 LL02 LL03 LL04 LL05 LL06 LL10
. Light-emitting bodies . . Light-emitting diodes . . Semiconductor lasers . Light-receiving bodies . . Solar cells . . Light sensors . Others
PP PP00
PRETREATMENTS AND AFTER-TREATMENTS
PP01 PP02 PP03 PP04 PP05 PP06 PP07 PP08
. Variants that clean . Variants that etch . Variants that perform heat treatment and annealing . Variants that perform meltback . Variants that perform reduction treatment . Variants that perform ion implantation . Variants that perform masking . Variants that perform mechanical grinding
PP11 PP12 PP13 PP14 PP20
. Variants that perform other types of growth . . Chemical vapor deposition (CVD) . . Physical vapor deposition (PVD) . . . Molecular beam epitaxial growth (MBE) . Others
RR RR00
PURPOSE, EFFECTS, AND FUNCTIONS
RR01 RR02 RR03 RR04 RR05 RR06 RR07 RR08
. Uniformity of growth substances . . Reduction of edge growth . Reduction of the rate of inclusion of defects in lattices . Stabilization of quality (e.g., to increase yield) . Improvement of manufacturing capability (e.g., shortening the manufacturing process and time) . . Continuous processing . Improvement of durability . Increase of output
RR11 RR12 RR13 RR14 RR20
. Improvement of light-emission characteristics . Improvement of photosensitivity characteristics . Improvement of economy (e.g., cost reduction, economizing on materials) . Environmental countermeasures . Others
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