G01R31/00	Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (testing or measuring semiconductors or solid state devices during manufacture H10P0074000000; testing line transmission systems H04B0003460000)[2006.01]
	Note(s) Groups G01R 31/08, G01R 31/12, G01R 31/24, G01R 31/26, G01R 31/327, G01R 31/34, G01R 31/36, G01R 31/40, G01R 31/44 take precedence over group G01R 31/50.[2020.01]